Abstract
The use of atomic force microscopy (AFM) and x-ray photoelectron spectroscopy (XPS) is described to characterize the inner surfaces of pharmaceutical vials. The two type I borosilicate glasses included in this study slightly differ in their amounts of alkaline oxides. The topography and chemistry of the inner surfaces of vials are predominantly caused by the forming process. A structural and chemical modification of the inner surface of vials was also observed when exposing the surface to different pH conditions and special treatment like washing and sterilization, which are routine operation steps during galenical manufacturing.
- Atomic force microscopy (AFM)
- borosilicate glass
- topography
- x-ray photoelectron spectroscopy (XPS)
- vials
Footnotes
- Copyright © Parenteral Drug Association. All rights reserved.
PDA members receive access to all articles published in the current year and previous volume year. Institutional subscribers received access to all content. Log in below to receive access to this article if you are either of these.
If you are neither or you are a PDA member trying to access an article outside of your membership license, then you must purchase access to this article (below). If you do not have a username or password for JPST, you will be required to create an account prior to purchasing.
Full issue PDFs are for PDA members only.
Note to pda.org users
The PDA and PDA bookstore websites (www.pda.org and www.pda.org/bookstore) are separate websites from the PDA JPST website. When you first join PDA, your initial UserID and Password are sent to HighWirePress to create your PDA JPST account. Subsequent UserrID and Password changes required at the PDA websites will not pass on to PDA JPST and vice versa. If you forget your PDA JPST UserID and/or Password, you can request help to retrieve UserID and reset Password below.