TABLE IV

HVLD Reliability for Product–Packages Stored 4 Days (Ambient) Plus 17 Days (2–8 °C)

HVLD Test Method	Test Samples	Total (Count)	Passed (Count)	Failed (Count)	Comments
1	Negative controls	18	18	0	n/a
	Positive controls, 2.5 μm	6	0	6	n/a
	Positive controls, 5 μm	6	0	6	n/a
	Positive controls, 10 μm	6	0	6	n/a
2	Negative controls	18	17	1	^¹Bag 33-23 = 4.10 V (Fail)
	Positive controls, 2.5 μm	6	0	6	n/a
	Positive controls, 5 μm	6	0	6	n/a
	Positive controls, 10 μm	6	0	6	n/a
3	Negative controls	6	5	1	^²Bag 34-6 = 8.85 V
	Positive controls, 2.5 μm	2	0	2	n/a
	Positive controls, 5 μm	2	0	2	n/a
	Positive controls, 10 μm	2	0	2	n/a
4	Negative controls	6	6	0	n/a
	Positive controls, 2.5 μm	2	1	1	^³Bag 38 = 2.66 V (Pass)
	Positive controls, 5 μm	2	0	2	n/a
	Positive controls, 10 μm	2	0	2	n/a
5	Negative controls	6	6	0	n/a
	Positive controls, 2.5 μm	2	0	2	n/a
	Positive controls, 5 μm	2	0	2	n/a
	Positive controls, 10 μm	2	0	2	n/a
6	Negative controls	6	6	0	n/a
	Positive controls, 2.5 μm	2	0	2	n/a
	Positive controls, 5 μm	2	0	2	n/a
	Positive controls, 10 μm	2	0	2	n/a

↵1 Bag 33-23 retest = 4.65 V, 4.82 V (Fail). Upon inspection, small seal leak found. True-positive result.
↵2 Bag 34-6 current arced to ground causing a voltage spike. Retests gave similar results; cause unclear.
↵3 Bag 38 retest = 4.70 V (Fail). Hole located in collapsed bag cavity.