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History
- Published online July 29, 2011.
Copyright & Usage
© PDA, Inc. 2011
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- Article
- Abstract
- Introduction
- Vial Supply
- Vial Defect Selection and Defect Manufacture
- Defect Characterization—Pre-Shipping Simulation
- Packaging Simulations
- Packaging and Transport to Contract Lab for Shipping Simulations
- Arrival at Contract Lab and Shipping Simulations
- Defect Characterization—Post-Shipping Simulation
- Dye Leak Testing
- White Light Interferometry: 3-Dimensional Defect Metrology
- Conclusion
- Conflict of Interest Declaration
- Acknowledgements
- Figures & Data
- References
- Info & Metrics
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